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商業展示プログラム
- 日時
- 2020年11月16日(月) 13:00-17:00
2020年11月17日(火) 9:30-17:00
2020年11月18日(水) 9:30-16:00
- 場所
- KFCホールAnnex (3F)
| No. | Corporation | Exhibition Title | Commercial Session No |
|---|
| 1 | Canon Marketing Japan Inc. | Submicron 3D X-ray Microscope PrismaXRM | (C8)? |
|---|
| 2 | Nippon Scientific Co., Ltd | New Laser Decapsulation system PL201D and others | |
|---|
| 3 | ITES Co., Ltd. | Introduction of power semiconductor evaluation and analysis | (C6)? |
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| 4 | Atomic scale elecromagnetic field analysis platform | Introduction of application experiments | |
|---|
| 5 | HiSOL, Inc. | New Analysis Devices | |
|---|
| 6 | Nippon barnes company, LTD. | Very high spatial resolution (down to 0.2 ?m) the T°Imager | |
|---|
| 7 | Aamilia Japan G.K. | Optical microscopy with computational super resolution, artificial intelligence (AI) and robotics "nSpec®” | |
|---|
| 8 | AD Science Inc. | Sputter Coaters and Carbon Coaters, Micro Manipulators, Nano Prober, In-situ Downstream Asher | |
|---|
| 9 | Toshiba Nanoanalysis Corporation | Semiconductor Analysis Services (Scanning Probe Microscopy, Magnetic Microscopy, 3D Atom Probe) | (C2)? |
|---|
| 10 | TOYO Corporation | TESCAN FIB-SEM system | |
|---|
| 11 | Renesas Engineering Services Co., Ltd | Introduction of reliability evaluation and fault localization analysis services | (C3)? |
|---|
| 12 | Nano Tech Solutions Inc. | Pulse Laser based Sample Preparation microPREP PRO | |
|---|
| 13 | Semilab Japan | Defect Inspection Tool En-Vison | |
|---|
| 14 | Oki Engineering Co., Ltd. | The New Failure Analysis System using Lock-In Thermal Emission | (C4)? |
|---|
| 15 | Kobelco Research Institute, Inc. | Applications of Laser-Raman Spectroscopy for Semiconductors | (C7)? |
|---|
| 16 | TOKI COMMERCIAL CO., LTD. | New Concept of Nano-Probing System | (C1)? |
|---|
| 17 | HIGHTEC SYSTEMS CORPORATION | JIACO MIP Decapsulation System & Neocera Magma MFI For Failure Analysis | |
|---|
- The fourth column (Commercial Session No) shows the presentation No. in the Commercial Session
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![[NANOTS]](image/NANOTS2023.png "[NANOTS]")
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