ナノテスティングシンポジウム

Annual Nano Testing Symposium

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NANOTS2020

商業展示プログラム

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商業展示レイアウト
日時
2020年11月16日(月) 13:00-17:00
2020年11月17日(火) 9:30-17:00
2020年11月18日(水) 9:30-16:00
場所
KFCホールAnnex (3F)
No.CorporationExhibition TitleCommercial Session No
1Canon Marketing Japan Inc.Submicron 3D X-ray Microscope PrismaXRM(C8)?
2Nippon Scientific Co., LtdNew Laser Decapsulation system PL201D and others
3ITES Co., Ltd.Introduction of power semiconductor evaluation and analysis(C6)?
4Atomic scale elecromagnetic field analysis platformIntroduction of application experiments
5HiSOL, Inc.New Analysis Devices
6Nippon barnes company, LTD.Very high spatial resolution (down to 0.2 ?m) the T°Imager
7Aamilia Japan G.K.Optical microscopy with computational super resolution, artificial intelligence (AI) and robotics "nSpec®”
8AD Science Inc.Sputter Coaters and Carbon Coaters, Micro Manipulators, Nano Prober, In-situ Downstream Asher
9Toshiba Nanoanalysis CorporationSemiconductor Analysis Services (Scanning Probe Microscopy, Magnetic Microscopy, 3D Atom Probe)(C2)?
10TOYO CorporationTESCAN FIB-SEM system
11Renesas Engineering Services Co., LtdIntroduction of reliability evaluation and fault localization analysis services(C3)?
12Nano Tech Solutions Inc.Pulse Laser based Sample Preparation microPREP PRO
13Semilab JapanDefect Inspection Tool En-Vison
14Oki Engineering Co., Ltd.The New Failure Analysis System using Lock-In Thermal Emission(C4)?
15Kobelco Research Institute, Inc.Applications of Laser-Raman Spectroscopy for Semiconductors(C7)?
16TOKI COMMERCIAL CO., LTD.New Concept of Nano-Probing System(C1)?
17HIGHTEC SYSTEMS CORPORATIONJIACO MIP Decapsulation System & Neocera Magma MFI For Failure Analysis
  • The fourth column (Commercial Session No) shows the presentation No. in the Commercial Session